Scientific Instruments Nijmegen
v.1.5
   


 
Microscopic Imaging

Light microscopy

Electron Microscopy

Element Analysis

Separation Techniques



Information and software



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3 devices in this category
Domain: RTC-M
FIB-SEM

Zeiss Crossbeam 550 (cryo) FIB-SEM

[details][not authorized]
Domain: RTC-M
JEOL JEM1400

JEOL JEM 1400

[details][not authorized]
Domain: RTC-M
Sigma300

Zeiss Sigma 300
Due to renovation of EMC, SEM Sigma300 can not be used from 13 june until 9 July between 7.00- 16.00

[details][not authorized]