Scientific Instruments Nijmegen
v.1.5
   


Categories - Misc. Equipment

  AFM
Statusred
Short nameAFM
Full nameAFM Nanoscope IIIa
CategoryMisc. Equipment
TechniqueNanoscope IIIa Atomic Force Microscope
LocationRT (M850) room 6.67
Accessresearcher after thorough and subject related instruction/training by qualified MIC personel
ApplicationsHigh resolution imaging of surface structures Force measurements (protein interactions)
Contact 1Jack Fransen
jack.fransen@radboudumc.nl