| Status | yellow |
| Short name | Sigma300 |
| Full name | Zeiss Sigma 300 |
| Message 2 | Due to renovation of EMC, SEM Sigma300 can not be used from 13 june until 9 July between 7.00- 16.00 |
| Category | Electron Microscopy |
| Technique | Zeiss Sigma 300 Field Emission Scanning Electron microscope |
| Location | EMC-CDL (M220) room 1.031A (r231) |
| Access | researcher after instruction by Dr. J.A.M. Fransen |
| Applications | field emission scanning electron microscopy with
X-ray EDS (Bruker Energy-Dispersive X-ray Spectrometry) for chemical (element) analysis, backscatter electron detector, STEM detector (scanning transmission electron microscopy) and Atlas 5 AT software. |
| Contact 1 | Mariska Kea - te Lindert
Mariska.Kea-teLindert@radboudumc.nl |
| Contact 2 | Martijn Martens
martijn.martens@radboudumc.nl |
| 47 |
| 100 |
| 87 |
| File 1 | file 1 |
