The Focus Ion Beam Scanning Electron Microscope (FIB-SEM) is equipped with a Secondary Electron and Secondary Ion detector (SESI-detector), an In-lens backscatter electron detector, and an In-lens secondary electron detector for imaging. The Gallium source Focus Ion Beam (FIB) is used for advanced 3D imaging of biological samples (serial slice and image -SSI) or advanced sample preparation for TEM, including FIB lamella preparation and FIB lift-out.

This FIB-SEM is also equipped with cryogenic system (Quorum) that allows (FIB)-SEM imaging and TEM sample preparation at -160 C.