Status | red |
Short name | AFM |
Full name | AFM Nanoscope IIIa |
Category | Misc. Equipment |
Technique | Nanoscope IIIa Atomic Force Microscope |
Location | RT (M850) room 6.67 |
Access | researcher after thorough and subject related instruction/training by qualified MIC personel |
Applications | High resolution imaging of surface structures
Force measurements (protein interactions) |
Contact 1 | Jack Fransen jack.fransen@radboudumc.nl |