Scientific Instruments Nijmegen
v.1.5
   


Categories - GI- Electron microscopy

  Cryo SEM
Statusgreen
Short nameCryo SEM
Full nameJEOL 6330 Cryo Field Emission Scanning Electron Microscope (FESEM)
Description

This JEOL FESEM can be used to make topographical images of the surface of objects, up to a resolution of about 1.5 nm.
It can be employed either in conventional SEM mode or as cryo-SEM.  In conventional use, the material needs to be naturally conductive or it has to be precoated with a thin layer of metal (use SEM coaters). In cryo-mode, the material is first fixed with nitrogen slush and transposed to the cryo-chamber. To observe inner structures, the frozen material can be cleaved, sublimated and coated with gold-palladium inside the vacuum cryo chamber.  

CategoryGI- Electron microscopy
LocationHG 01.244
Contact 1Geert-Jan Janssen
gja.Janssen@science.ru.nl
Room: Huygens 01.222
Contact 2Liesbeth Pierson
e.pierson@science.ru.nl
Room: HG01.222
Internet linkhttp://www.ru.nl/science/gi/facilities/electron-microscopy/scanning-em/
File 1General SEM guide Jeol