Scientific Instruments Nijmegen
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Categories - Electron Microscopy

  FIB-SEM
Statusyellow
Short nameFIB-SEM
Full nameZeiss Crossbeam 550 (cryo) FIB-SEM
Description

The Focus Ion Beam Scanning Electron Microscope (FIB-SEM) is equipped with a Secondary Electron and Secondary Ion detector (SESI-detector), an In-lens backscatter electron detector, and an In-lens secondary electron detector for imaging. The Gallium source Focus Ion Beam (FIB) is used for advanced 3D imaging of biological samples (serial slice and image -SSI) or advanced sample preparation for TEM, including FIB lamella preparation and FIB lift-out.

This FIB-SEM is also equipped with cryogenic system (Quorum) that allows (FIB)-SEM imaging and TEM sample preparation at -160 C.

CategoryElectron Microscopy
TechniqueZeiss Crossbeam 550 (cryo) Focussed Ion BeamScanning Electron microscope for advanced (cryo)3D imaging of biological samples
LocationEMC-CDL (M220) room 1.031 (r231)
Accessresearcher after thorough and subject related instruction/training
ApplicationsAdvanced (cryo)3D imaging of biological samples (serial slice and image -SSI) or advanced sample preparation for TEM, including FIB lamella preparation and FIB lift-out.
Contact 1Anat Akiva
Anat.Akiva@radboudumc.nl
Contact 2Jack Fransen
jack.fransen@radboudumc.nl